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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Testing for Resistive and Stuck Opens
Details
Testing for Resistive and Stuck Opens
Journal
International Test Conference
Pages
1049-1058
Date Issued
2001-01
Author(s)
CHIEN-MO LI
Li, J. C.M.
Tseng, C.W.
E.J. McCluskey
CHIEN-MO LI
DOI
10.1109/test.2001.966731
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/294588
Type
conference paper