Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Bioresources and Agriculture / 生物資源暨農學院
Biomechatronics Engineering / 生物機電工程學系
Applications of damage models to reliability investigations for input/output electronic connectors
Details
Applications of damage models to reliability investigations for input/output electronic connectors
Journal
American Society of Mechanical Engineers, Safety Engineering and Risk Analysis Division, SERA
Date Issued
2006
Author(s)
KUO-CHI LIAO
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-84920632493&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/321619
Type
conference paper