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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
An IR-drop aware test pattern generator for scan-based at-speed testing
Details
An IR-drop aware test pattern generator for scan-based at-speed testing
Journal
Asian Test Symposium
Date Issued
2016
Author(s)
P.-F. Hou
Y.-T. Lin
J.-L. Huang
A. Shih
Z. F. Conroy
JIUN-LANG HUANG
DOI
10.1109/ats.2016.23
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429674
Type
conference paper