A low-cost jitter measurement technique for BIST applications
Resource
Test Symposium, 2003. ATS 2003. 12th Asian
Journal
Proceedings of the Asian Test Symposium
Journal Volume
2003-January
Pages
336 - 339
Date Issued
2003-11
Author(s)
J. J. Huang
Abstract
In this paper, we present a technique to measure the RMS period jitter of the signal under test. In the proposed approach, the lead/lag relationships between the signal under test and two delayed versions of itself are compared. The collected information corresponds to two points along the jitter's cumulative distribution function (CDF) curve from which the RMS period jitter value can be derived. Currently, SPICE simulation results show less than 5% error for RMS jitter values ranging from 40 to 60 ps. © 2003 IEEE.
Event(s)
12th Asian Test Symposium, ATS 2003
Other Subjects
Distribution functions; SPICE; Cumulative distribution function; Jitter measurements; Low costs; Period jitter; RMS jitter; SPICE simulations; Two-point; Jitter
Type
conference paper
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