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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on Belief Propagation
Details
An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on Belief Propagation
Journal
IEEE International Symposium on Circuits and Systems
Pages
608-611
Date Issued
2008
Author(s)
AN-YEU(ANDY) WU
Rao, H.
Chen, J.
Zhao, V.H.
Ang, W.T.
Wey, I.-C.
AN-YEU(ANDY) WU
DOI
10.1109/ISCAS.2008.4541491
URI
http://www.scopus.com/inward/record.url?eid=2-s2.0-51749118706&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/341342
Type
conference paper
