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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
A self-testing and calibration method for embedded successive approximation register ADC
Details
A self-testing and calibration method for embedded successive approximation register ADC
Journal
Asia and South Pacific Design Automation Conference
Pages
713-718
Date Issued
2011-01
Author(s)
X.-L. Huang
P.-Y. Kang
H.-M. Chang
J.-L. Huang
Y.-F. Chou
Y.-P. Lee
D.-M. Kwai
C.-W. Wu
JIUN-LANG HUANG
DOI
10.1109/ASPDAC.2011.5722279
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/366763
Type
conference paper