A sigma-delta modulation based BIST scheme for mixed-signal circuits
Journal
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Pages
605 - 610
Date Issued
2000
Author(s)
Cheng, K.-T.
Abstract
In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits. © 2000 IEEE.
Event(s)
2000 Asia and South Pacific Design Automation Conference, ASP-DAC 2000
Other Subjects
Accurate measurement; Analog circuitry; Builtin self-test (BIST); High quality; Mixed-signal circuits; On chips; Response analysis; Sigma-Delta modulation; Built-in self test; Computer aided design; Delta sigma modulation; Analog circuits
Type
conference paper