Testing Second-Order Delta-Sigma Modulators using Pseudo-Random Patterns

Journal

Microelectronics Journal

Journal Volume

33

Journal Issue

10

Pages

807-814

Date Issued

2002-10

Author(s)

C. K. Ong

J. L. Huang

K. T. Cheng

JIUN-LANG HUANG

DOI

10.1016/S0026-2692(02)00096-4

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/299313

Type

journal article