Testing Second-Order Delta-Sigma Modulators using Pseudo-Random Patterns
Journal
Microelectronics Journal
Journal Volume
33
Journal Issue
10
Pages
807-814
Date Issued
2002-10
Author(s)
Abstract
Single-bit second-order delta-sigma modulators are commonly used in high-resolution analog-to-digital converters (ADCs). This type of modulator requires high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator by characterizing its key parameters using a pseudo-random pattern sequence. This technique is suitable for BIST application since a pseudo-random sequence can be generated on-chip using LFSR. Numerical simulation results show that this technique is capable of identifying parameters that affect the performance of a second-order delta-sigma modulator ADC. © 2002 Published by Elsevier Science Ltd.
Type
journal article