Photo response enhancement in MIS(p) tunnel diode via coupling effect by controlling neighboring device inversion level

Journal

ECS Journal of Solid State Science and Technology

Journal Volume

6

Journal Issue

10

Pages

Q143-Q147

Date Issued

2017

Author(s)

Hou, W.-T.

DOI

10.1149/2.0031712jss

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500717

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85033798778&doi=10.1149%2f2.0031712jss&partnerID=40&md5=1e5ed40374596ffe5099639a937ed9a7

Type

journal article