VLSI Test Principles and Architectures
ISBN
9780123705976
Date Issued
2006-01
Author(s)
Laung-Terng Wang
Cheng-Wen Wu
Xiaoqing Wen
Khader S. Abdel-Hafez
Wen-Ben Jone
Rohit Kapur
Brion Keller
Kuen-Jong Lee
Mike Peng Li
Xiaowei Li
T.M. Mak
Yinghua Min
Benoit Nadeau-Dostie
Soumendu Bhattacharya
Mehrdad Nourani
Janusz Rajski
Charles Stroud
Erik H. Volkerink
Duncan M. (Hank) Walker
Shianling Wu
Nur A. Touba
Abhijit Chatterjee
Xinghao Chen
Kwang-Ting (Tim) Cheng
William Eklow
Michael S. Hsiao
Shi-Yu Huang
Type
book