Observation of inversion layers at GA2O3-GaAs interfaces fabricated by in-situ molecular-beam epitaxy

Journal

Electronics Letters

Journal Volume

32

Journal Issue

3

Pages

267-269

Date Issued

1996

Author(s)

Passlack, M.

Mannaerts, J.P.

DOI

10.1049/el:19960125

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/443498

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0030085927&doi=10.1049%2fel%3a19960125&partnerID=40&md5=08fc173748bf64dae57822ed8cc1d403

Type

journal article