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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Analysis of Tunable Internal Loss Caused by Franz-Keldysh Absorption in Transistor Lasers
Details
Analysis of Tunable Internal Loss Caused by Franz-Keldysh Absorption in Transistor Lasers
Journal
IEEE Journal of Selected Topics in Quantum Electronics
Journal Volume
21
Journal Issue
6
Date Issued
2015
Author(s)
Wang, H.-L.
Huang, Y.-H.
Cheng, G.-S.
Chang, S.-W.
CHAO-HSIN WU
DOI
10.1109/JSTQE.2015.2438814
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/505938
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84958212683&doi=10.1109%2fJSTQE.2015.2438814&partnerID=40&md5=d567fdf875a5795a059ca2ade1c57b82
Type
journal article