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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Improved weight assignment for logic switching activity during at-speed test pattern generation
Details
Improved weight assignment for logic switching activity during at-speed test pattern generation
Journal
Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Pages
493-498
Date Issued
2010
Author(s)
Wu, M.-F.
Pan, H.-C.
Wang, T.-H.
Huang, J.-L.
Tsai, K.-H.
Cheng, W.-T.
JIUN-LANG HUANG
DOI
10.1109/ASPDAC.2010.5419834
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501341
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-77951233096&doi=10.1109%2fASPDAC.2010.5419834&partnerID=40&md5=7ebb02e79f21d738841895215dab6b50
Type
conference paper