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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
CSER: BISER-based concurrent soft-error resilience
Details
CSER: BISER-based concurrent soft-error resilience
Journal
VLSI Test Symposium (VTS)
Date Issued
2010-04
Author(s)
CHIEN-MO LI
JIUN-LANG HUANG
Laung-Terng Wang
Touba, N.A.
Zhigang Jiang
Shianling Wu
Jiun-Lang Huang
CHIEN-MO LI
JIUN-LANG HUANG
DOI
10.1109/vts.2010.5469588
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/359584
Type
conference paper