Traveling wave method for measurement of thermal conductivity of thin films
Journal
Review of Scientific Instruments
Journal Volume
68
Journal Issue
11
Pages
4180-4183
Date Issued
1997
Author(s)
Abstract
We present here the design of a novel and simple setup for measuring the thermal conductivity of thin films. This method is based on the well known principle of phase lag of a traveling thermal wave. In the present setup, the traveling thermal wave is generated in the thin film by irradiating its one edge by an infrared laser. The phase lag (Δθ) between the excitation wave and the resulting thermal wave, at a variable distance d from the edge of the sample, is determined by measuring the deflection of another "probe-laser." The thermal diffusivity is then directly calculated from the slope of the plot between Δθ and d. This method offers an accuracy of better than ±5%. © 1997 American Institute of Physics.
SDGs
Other Subjects
Aluminum;Calculations;Copper;Glass;Helium neon lasers;Laser beam effects;Metallic films;Silicon;Thermal diffusion in solids;Thin films;Phase lag;Thermal conductivity measurement;Thermal diffusivity;Traveling wave;Thermal conductivity of solids
Type
journal article