https://scholars.lib.ntu.edu.tw/handle/123456789/616459
標題: | Traveling wave method for measurement of thermal conductivity of thin films | 作者: | Bhusari D.M. Teng C.W. Chen K.H. Wei S.L. Chen L.C. LI-CHYONG CHEN |
公開日期: | 1997 | 卷: | 68 | 期: | 11 | 起(迄)頁: | 4180-4183 | 來源出版物: | Review of Scientific Instruments | 摘要: | We present here the design of a novel and simple setup for measuring the thermal conductivity of thin films. This method is based on the well known principle of phase lag of a traveling thermal wave. In the present setup, the traveling thermal wave is generated in the thin film by irradiating its one edge by an infrared laser. The phase lag (Δθ) between the excitation wave and the resulting thermal wave, at a variable distance d from the edge of the sample, is determined by measuring the deflection of another "probe-laser." The thermal diffusivity is then directly calculated from the slope of the plot between Δθ and d. This method offers an accuracy of better than ±5%. © 1997 American Institute of Physics. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0031276605&doi=10.1063%2f1.1148364&partnerID=40&md5=e52ad0a2d7a88f4be06fc410bfebce57 https://scholars.lib.ntu.edu.tw/handle/123456789/616459 |
ISSN: | 00346748 | DOI: | 10.1063/1.1148364 | SDG/關鍵字: | Aluminum;Calculations;Copper;Glass;Helium neon lasers;Laser beam effects;Metallic films;Silicon;Thermal diffusion in solids;Thin films;Phase lag;Thermal conductivity measurement;Thermal diffusivity;Traveling wave;Thermal conductivity of solids |
顯示於: | 凝態科學研究中心 |
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