Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment

Journal

IEEE Transactions on Compuuter-Aided Design

Journal Volume

28

Journal Issue

11

Pages

1767-1776

Date Issued

2009-11

Author(s)

M.-F. Wu

J.-L. Huang

X. Wen

K. Miyase

JIUN-LANG HUANG

DOI

10.1109/TCAD.2009.2030440

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/352469

Type

journal article