Correlation of grain orientations and the thickness of gradient MoS2films
Journal
RSC Advances
Journal Volume
11
Journal Issue
54
Pages
34269-34274
Date Issued
2021
Author(s)
Abstract
In this study, we synthesized gradient MoS2 films with a home-made suspended mask and characterized them by transmission electron microscopy (TEM) and Raman spectroscopy. The advantage of using gradient films is to simultaneously produce numerous samples under the same growth condition but with different thicknesses. The cross-sectional TEM images and their Fourier transform spectra revealed the thickness dependency of the grain orientations for synthetic MoS2 films. Combining the TEM results and the data of Raman A1g and E12g peaks, we found the correlation between the grain orientation and the A1g/E12g peak area ratio. We demonstrated the potential of using the non-polarized Raman Spectroscopy to characterize the grain structures of synthetic MoS2 films. This journal is ? The Royal Society of Chemistry.
Subjects
High resolution transmission electron microscopy; Layered semiconductors; Raman spectroscopy; Sulfur compounds; Cross-sectional transmission electron microscopy; Different thickness; Fourier transform spectrum; Gradient film; Grain orientation; Growth conditions; Peak area ratios; Polarized raman spectroscopy; Synthesised; Transmission electron microscopy images; Molybdenum compounds
Type
journal article