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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm
Details
A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm
Journal
IEEE Journal of Solid-State Circuits
Journal Volume
55
Journal Issue
3
Pages
817-825
Date Issued
2020
Author(s)
Liang, Z.-Y.
Wei, H.-H.
TSUNG-TE LIU
DOI
10.1109/JSSC.2019.2942374
URI
https://www.scopus.com/inward/record.url?eid=2-s2.0-85080908049&partnerID=40&md5=8c0720f2899caf3e701d2a536f0411b6
https://scholars.lib.ntu.edu.tw/handle/123456789/559264
Type
journal article
