Cell-based interconnection network design and the all-pairs examination problem
Resource
The International Journal of Electronics 67 (4): 503-512
Journal
International Journal of Electronics
Journal Volume
67
Journal Issue
4
Pages
503-512
Date Issued
1989
Author(s)
Abstract
A systematic procedure for the design of VLSI cell-based interconnection networks is proposed through the concept of the all-pairs examination problem. Since there are no line intersections between the intermodular interconnections of the proposed network, it is very suitable for planar VLSI implementation. © 1989 Taylor & Francis Ltd.
Other Subjects
All-Pairs Examination Problem; Cell-Based Interconnection Network Design; Merging Process; Planar VLSI; Switching Functions; Integrated Circuits, VLSI; article; electronics
Type
journal article
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