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College of Science / 理學院
Applied Physics / 應用物理研究所
Fundamental Study and Oxide Reliability of the MBE-Grown Ga 2- x Gd x O 3 Dielectric Oxide for Compound Semiconductor MOSFETs
Details
Fundamental Study and Oxide Reliability of the MBE-Grown Ga 2- x Gd x O 3 Dielectric Oxide for Compound Semiconductor MOSFETs
Journal
MRS Proceedings
Journal Volume
811
Pages
E1-12
Date Issued
2004
Author(s)
Kwo, J
MINGHWEI HONG
Mannaerts, JP
Lee, YJ
Wu, YD
Lee, WG
Milkap, S
Yang, B
Gustaffson, T
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/308680
Type
journal article
