A FABRICATION PROCESS VARIATION BASED APPROACH TO EVALUATE DESIGN-FOR-TEST TECHNIQUES
Resource
Bulletin of the College of Engineering, N.T.U., No. 93, February 2005, pp. 63–70
Journal
Bulletin of the College of Engineering
Journal Issue
No. 93
Pages
-
Date Issued
2005-02
Date
2005-02
Author(s)
Chen, Yi-Ren
DOI
2006092712273575777
Abstract
One of the hurdles that prevent the wide acceptance of
analog/mixed-signal design-for-test techniques is lack of a
realistic and practical evaluation methodology. In this
paper, a method to assess the quality of a design-for-test
design (together with the associated test set) is proposed.
Based on fabrication process variation information, our
design-for-test evaluation criterion considers the inevitable
adverse effects of fabrication process imperfection on both
the functional and design-for-test circuits, and therefore
will correlate better with the manufacturing test quality
than past proposals. To validate our method, a flash ADC
with a built-in ramp generator is used as an ex-ample.
The proposed approach shows that the original designfor-
test design fails capturing dynamic defects, and a
redesign of the ramp generator or the test set is necessary to
enhance the manufacturing test quality.
Subjects
design-for-test
mixed-signal testing
analogto-
digital converter
digital converter
INL
DNL
Publisher
臺北市:國立臺灣大學工學院
Type
journal article
File(s)![Thumbnail Image]()
Loading...
Name
n93-8.pdf
Size
270.15 KB
Format
Adobe PDF
Checksum
(MD5):eb9e080474edf4e41ca76f346d36d22d