Measurement of linewidth enhancement factor in 1.3 �gm quantum dot and quantum well vertical-cavity surface-emitting lasers

Journal

Conference Digest - IEEE International Semiconductor Laser Conference

Pages

35-36

Date Issued

2008

Author(s)

Peng, P.C.

Yeh, C.E.

Kuo, H.C.

Yang, S.H.

Xuan, R.

Lin, G.

Chi, J.Y.

Wang, S.C.

DOI

10.1109/ISLC.2008.4635996

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/500108

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-56749158363&doi=10.1109%2fISLC.2008.4635996&partnerID=40&md5=ac4c929a6ca8de84c615734b5d90c3e0

Type

conference paper