Measurement of linewidth enhancement factor in 1.3 �gm quantum dot and quantum well vertical-cavity surface-emitting lasers
Journal
Conference Digest - IEEE International Semiconductor Laser Conference
Pages
35-36
Date Issued
2008
Author(s)
Abstract
This work for the first time, experimentally investigated the linewidth enhancement factor (alpha factor) of quantum dot vertical cavity surface emitting laser. alpha factor values between 0.48 and 0.60 were measured.
Type
conference paper