Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Photonics and Optoelectronics / 光電工程學研究所
Device scaling physics and channel velocities in AlGaN/GaN HFETs: Velocities and effective gate length
Details
Device scaling physics and channel velocities in AlGaN/GaN HFETs: Velocities and effective gate length
Journal
IEEE Transactions on Electron Devices
Journal Volume
53
Journal Issue
4
Pages
588-593
Date Issued
2006
Author(s)
YUH-RENN WU
Singh, M
Singh, J
DOI
10.1109/TED.2006.870571
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/321642
SDGs
[SDGs]SDG7
Type
journal article