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College of Electrical Engineering and Computer Science / 電機資訊學院
Computer Science and Information Engineering / 資訊工程學系
Automatic probe alignment for atomic force microscope
Details
Automatic probe alignment for atomic force microscope
Journal
Proceedings of the 2005 IEEE International Conference on Mechatronics, ICM '05
Journal Volume
2005
Pages
909-912
Date Issued
2005
Author(s)
Hung, S.-K.
Tsai, C.-F.
Hsu, Y.-P.
Tzou, D.-J.
Lin, M.-H.
LI-CHEN FU
DOI
10.1109/ICMECH.2005.1529383
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/488926
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-33748887229&doi=10.1109%2fICMECH.2005.1529383&partnerID=40&md5=f3a299d1377f5d3b826b5f97f7ccb086
Type
conference paper