Power supply noise reduction in broadcast-based compression environment for at-speed scan testing
Journal
Asian Test Symposium
Pages
361-366
Date Issued
2010-12
Author(s)
Abstract
This work proposes a power supply noise reduction technique for at-speed testing in the broadcast-based test compression environment. The core technology is the X-slice creation technique, it comprises the scan-chain skew-insertion hardware and the skew configuration generation algorithm. With the created X-slices, the efficiency of X-slice filling to lower the launch cycle switching activity is improved. Effectiveness of the proposed technique is validated with ISCAS89 and ITC99 benchmark circuits.
SDGs
Type
conference paper
