A built-in gain calibration technique for RF low-noise amplifiers

Journal

Proceedings of the IEEE VLSI Test Symposium

Date Issued

2014

Author(s)

Wu, Y.-R.

Hsieh, Y.-K.

Ku, P.-C.

DOI

10.1109/VTS.2014.6818776

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/498177

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84901935802&doi=10.1109%2fVTS.2014.6818776&partnerID=40&md5=d4bfe1901189e331a17b741443a98440

Type

conference paper