Intelligent process diagnosis based on end-of-line electrical test data

Journal

IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

Pages

347-354

Date Issued

1996

Author(s)

Guo, Ruey-Shan

Tsai, Cheng-Kai

Lee, Jian-Huei

SHI-CHUNG CHANG

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-0030385243&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/324145

Type

conference paper