Publication: Test generation of path delay faults induced by defects in power TSV
| cris.lastimport.scopus | 2025-05-14T22:12:27Z | |
| cris.virtual.department | Electrical Engineering | |
| cris.virtual.department | Communication Engineering | |
| cris.virtual.department | Electronics Engineering | |
| cris.virtual.department | Electrical Engineering | |
| cris.virtual.department | Electrical Engineering | |
| cris.virtual.department | Electronics Engineering | |
| cris.virtual.department | MediaTek-NTU Research Center | |
| cris.virtual.orcid | 0000-0002-3560-8898 | en_US |
| cris.virtual.orcid | 0000-0002-7638-0367 | en_US |
| cris.virtual.orcid | 0000-0002-4393-5186 | en_US |
| cris.virtualsource.department | 6f4b5247-f7b2-4c9d-a362-ee8e896ecc01 | |
| cris.virtualsource.department | 6f4b5247-f7b2-4c9d-a362-ee8e896ecc01 | |
| cris.virtualsource.department | 970a3d74-908b-4cce-ac04-054931017776 | |
| cris.virtualsource.department | 970a3d74-908b-4cce-ac04-054931017776 | |
| cris.virtualsource.department | 24e3be6c-c3d4-4d22-8796-f1312d48ec3b | |
| cris.virtualsource.department | 24e3be6c-c3d4-4d22-8796-f1312d48ec3b | |
| cris.virtualsource.department | 24e3be6c-c3d4-4d22-8796-f1312d48ec3b | |
| cris.virtualsource.orcid | 6f4b5247-f7b2-4c9d-a362-ee8e896ecc01 | |
| cris.virtualsource.orcid | 970a3d74-908b-4cce-ac04-054931017776 | |
| cris.virtualsource.orcid | 24e3be6c-c3d4-4d22-8796-f1312d48ec3b | |
| dc.contributor.author | Shih, C.-J. | en_US |
| dc.contributor.author | Hsieh, S.-A. | en_US |
| dc.contributor.author | Lu, Y.-C. | en_US |
| dc.contributor.author | Li, J.C.-M. | en_US |
| dc.contributor.author | Wu, T.-L. | en_US |
| dc.contributor.author | TZONG-LIN WU | en_US |
| dc.contributor.author | YI-CHANG LU | en_US |
| dc.contributor.author | CHIEN-MO LI | en_US |
| dc.creator | Shih, C.-J.;Hsieh, S.-A.;Lu, Y.-C.;Li, J.C.-M.;Wu, T.-L.;Chakrabarty, K. | |
| dc.date.accessioned | 2020-06-11T06:15:26Z | |
| dc.date.available | 2020-06-11T06:15:26Z | |
| dc.date.issued | 2013 | |
| dc.identifier.doi | 10.1109/ATS.2013.18 | |
| dc.identifier.scopus | 2-s2.0-84893436993 | |
| dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/498068 | |
| dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893436993&doi=10.1109%2fATS.2013.18&partnerID=40&md5=f1f5f24206fe6aa814ff1027e3880c77 | |
| dc.relation.ispartof | Proceedings of the Asian Test Symposium | |
| dc.relation.pages | 43-48 | |
| dc.title | Test generation of path delay faults induced by defects in power TSV | en_US |
| dc.type | conference paper | |
| dspace.entity.type | Publication |