Test-Clock Domain Optimization for Peak Power-Supply Noise Reduction During Scan
Journal
International Test Conference
Date Issued
2011-01
Author(s)
R.Y. Wen
Y.C. Huang
M.H. Tsai
K.Y. Liao
J. C.-M. Li
M.-T. Chang
M.-H. Tsai
C.-M. Tseng
H.-C. Li
Type
conference paper