Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Simultaneous capture and shift power reduction test pattern generator for scan testing
Details
Simultaneous capture and shift power reduction test pattern generator for scan testing
Journal
IET Computers & Digital Techniques
Journal Volume
2
Journal Issue
2
Pages
132-141
Date Issued
2008-03
Author(s)
CHIEN-MO LI
H.T. Lin
CHIEN-MO LI
DOI
10.1049/iet-cdt:20070088
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/343002
SDGs
[SDGs]SDG7
Type
journal article
