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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Degradation induced recombination-zone shift in mixed-host organic light-emitting device
Details
Degradation induced recombination-zone shift in mixed-host organic light-emitting device
Journal
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Date Issued
2007
Author(s)
Tseng, C.-A.
Hsiao, C.-H.
JIUN-HAW LEE
DOI
10.1109/CLEOPR.2007.4391160
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/498329
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-51249103901&doi=10.1109%2fCLEOPR.2007.4391160&partnerID=40&md5=af2a713ed9c3174fd3e9099fbd13e08f
Type
conference paper