Degradation induced recombination-zone shift in mixed-host organic light-emitting device
Journal
Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Date Issued
2007
Author(s)
Abstract
We investigate the degradation phenomena in a mixed-host organic light-emitting device by using an ultra thin red-emitting dopant as the probe for monitoring the recombination rate in the emitting layer. After the current stressing, the recombination peak shifts toward the hole-transport-layer side and the recombination zone becomes broader.
SDGs
Type
conference paper