Dynamic bias instability of p-channel polycrystalline-silicon thin-film transistors induced by impact ionization
Journal
IEEE Electron Device Letters
Journal Volume
30
Journal Issue
4
Pages
368-370
Date Issued
2009
Author(s)
Huang, C.-F.
Sun, H.-C.
Yang, Y.-J.
Chen, Y.-T.
Ku, C.-Y.
Liu, C.W.
Hsu, Y.-J.
Shih, C.-C.
Chen, J.-S.
Type
journal article