Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors
Journal
International Conference on Solid-State and Integrated Circuits Technology, ICSICT
Pages
624-627
Date Issued
2008
Author(s)
Huang, C.-F.
Chen, Y.-T.
Sun, H.-C.
Liu, C.W.
Hsu, Y.-C.
Shih, C.-C.
Lin, K.-C.
Chen, J.-S.
Type
conference paper