Influence of the thickness variation of the SiOx layer on the Si quantum dots based MOSLED

Journal

2010 Asia Communications and Photonics Conference and Exhibition

Pages

56-57

Date Issued

2010

Author(s)

Lai, B.-H.

Cheng, C.-H.

DOI

10.1109/ACP.2010.5682837

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-79851497080&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/358008

Type

conference paper