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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Testing
Details
Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Testing
Journal
International Test Conference
Date Issued
2008-10
Author(s)
M.-F. Wu
J.-L. Huang
X. Wen
K. Miyase
JIUN-LANG HUANG
DOI
10.1109/TEST.2008.4700584
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/342976
SDGs
[SDGs]SDG7
Type
conference paper
