Skip to main content
English
中文
Log In
Log in
Log in with ORCID
NTU Single Sign On
Have you forgotten your password?
Home
College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Determine the Minority Carrier Lifetime in P/N Junction Diode Using the Lag Effect of a CID Emulator
Details
Determine the Minority Carrier Lifetime in P/N Junction Diode Using the Lag Effect of a CID Emulator
Resource
17th EDMS, p.213-216
Journal
17th EDMS
Pages
213-216
Date Issued
1987
Date
1987
Author(s)
Lin, Hao-Hsiung
URI
http://ntur.lib.ntu.edu.tw//handle/246246/121318
Type
conference paper
