X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD
Journal
2016 5th International Symposium on Next-Generation Electronics, ISNE 2016
Date Issued
2016
Author(s)
Xin, J.
Chang, C.M.
Hsueh, C.-H.
Lee, J.-F.
Chen, J.-M.
Lin, H.-H.
Lu, N.
Ferguson, I.T.
Guan, Y.
Wan, L.
Yang, Q.
Feng, Z.C.
Type
conference paper