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College of Science / 理學院
Applied Physics / 應用物理研究所
Measuring and modeling the scaling trend of the RF noise in MOSFETs
Details
Measuring and modeling the scaling trend of the RF noise in MOSFETs
Journal
2006 64th Device Research Conference
Date Issued
2006
Author(s)
Kao, H
Chin, Albert
Liao, C
Mcalister, Sean
Kwo, J
MINGHWEI HONG
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/323246
Type
book part