Ge outdiffusion effect on flicker noise in strained-Si nMOSFETs

Journal

IEEE Electron Device Letters

Journal Volume

25

Journal Issue

10

Pages

693-695

Date Issued

2004

Author(s)

Hua, W.-C.

Lee, M.H.

Chen, P.S.

Maikap, S.

Liu, C.W.

Chen, K.M.

DOI

10.1109/LED.2004.834884

URI

http://www.scopus.com/inward/record.url?eid=2-s2.0-5044252616&partnerID=MN8TOARS

http://scholars.lib.ntu.edu.tw/handle/123456789/309373

Type

journal article