Test point selection for analog fault diagnosis of unpowered circuit boards
Journal
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Journal Volume
47
Journal Issue
10
Pages
977-987
Date Issued
2000
Author(s)
Abstract
Modern densely loaded circuit boards have posed problems for fault diagnosis with in-circuit testers because only limited physical access to the boards is allowed. In this paper, we present an efficient graph-based test-point selection algorithm for analog fault diagnosis of unpowered circuit boards. In addition to finding the sets of test points that allow one to differentiate between the elements under diagnosis, the algorithm can serve as a design for testability (DfT) guide for circuit board design. Experimental results on some industrial designs show that, in general, access to 50% of the nodes is sufficient to diagnose all the elements.
SDGs
Type
journal article