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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
Broadcast test pattern generation considering skew-insertion and partial-serial scan
Details
Broadcast test pattern generation considering skew-insertion and partial-serial scan
Journal
International Symposium on VLSI Design, Automation, and Test
Pages
256-259
Date Issued
2011-04
Author(s)
C.-J. Lin
J.-L. Huang
JIUN-LANG HUANG
DOI
10.1109/VDAT.2011.5783624
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/366764
Type
conference paper