Broadcast test pattern generation considering skew-insertion and partial-serial scan
Journal
International Symposium on VLSI Design, Automation, and Test
Pages
256-259
Date Issued
2011-04
Author(s)
Abstract
Broadcast scan test patterns suffer low fault detection efficiency due to the broadcast induced test pattern constraints. This paper presents a test pattern generation technique for broadcast scan that's capable of skew insertion and partial-serial scan — the former alters while the latter partially removes the test pattern constraints due to the broadcast mechanism. The proposed test pattern generator integrates the skew insertion and partial-serial scan capability into its decision-making procedure; this tight hardware/software integration achieves high fault coverage and compression performance without modifying the circuit under test. Experimental results on ISCAS89 and ITC99 benchmark circuits are presented to validate its effectiveness.
SDGs
Type
conference paper