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On the hot-zone design of Czochralski silicon growth for photovoltaic applications

Resource
Journal of Crystal Growth 261 (4): 433-443
Journal
Journal of Crystal Growth
Journal Volume
261
Journal Issue
4
Pages
433-443
Date Issued
2004
Date
2004
Author(s)
Huang, L. Y.
Lee, P. C.
Hsieh, C. K.
Hsu, W. C.
CHUNG-WEN LAN 
DOI
10.1016/j.jcrysgro.2003.09.039
URI
http://ntur.lib.ntu.edu.tw//handle/246246/87472
Abstract
Several hot-zone designs are presented for Czochralski photovoltaic silicon growth. Without sacrificing the crystal quality, a significant reduction of power and argon consumption was achieved, while the pulling rate was significantly increased. More importantly, the oxygen content in the grown crystals was greatly reduced leading to longer minority lifetime. The degradation rate of the graphite elements was greatly reduced as well. The design reported here included the radiation shield (molybdenum and graphite with different coatings), additional side and bottom insulations (graphite and graphite felt), and a top side insulation. Good agreement was found between computer modeling and experimental measurements in the power consumption and a reference temperature near the heater. Furthermore, the effect of the hot-zone design on the interface concavity is discussed through computer simulation. © 2003 Elsevier B.V. All rights reserved.
SDGs

[SDGs]SDG7

Other Subjects
Computer simulation; Crystal defects; Heat transfer; Interfaces (materials); Photovoltaic effects; Radiation shielding; Semiconducting silicon; Photovoltaic applications; Power consumption; Crystal growth from melt
Type
journal article

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