Design and Implementation of Cost-Efficient Probabilistic-Based Noise-Tolerant VLSI Circuits
Journal
IEEE Transactions onCircuits and Systems Part-I: Regular Papers
Journal Volume
56
Journal Issue
11
Pages
1450-1454
Date Issued
2009
Author(s)
Abstract
As the size of CMOS devices is scaled down to nanometers, noise can significantly affect circuit performance. Because noise is random and dynamic in nature, a probabilistic-based approach is better suited to handle these types of errors compared with conventional CMOS designs. In this paper, we propose a cost-effective probabilistic-based noise-tolerant circuit-design methodology. Our cost-effective method is based on master-and-slave Markov random field (MRF) mapping and master-and-slave MRF logic-gate construction. The resulting probabilistic-based MRF circuit trades hardware cost for circuit reliability. To demonstrate a noise-tolerant performance, an 8-bit MRF carry-lookahead adder (MRF-CLA) was implemented using the 0.13-μm CMOS process technology. The chip measurement results show that the proposed master-and-slave MRF-CLA can provide a 7.00× 10-5 bit-error rate (BER) under 10.6-dB signal-to-noise ratio, while the conventional CMOS-CLA can only provide 8.84×10-3 BER. Because of high noise immunity, the master-and-slave MRF-CLA can operate under 0.25 V to tolerate noise interference with only 1.9 μW of energy consumption. Moreover, the transistor count can be reduced by 42% as compared with the direct-mapping MRF-CLA design. © 2006 IEEE.
Subjects
Cost-effective hardware design; Markov random field (MRF); Master-and-slave MRF mapping; Noise-tolerant circuit; Probabilistically based circuit
SDGs
Other Subjects
Bit error rate; CMOS integrated circuits; Energy utilization; Integrated circuit design; Integrated circuit manufacture; Magnetorheological fluids; Mapping; Markov processes; Random errors; Signal to noise ratio; Timing circuits; VLSI circuits; Carry look-ahead adder; Circuit reliability; CMOS process technology; Cost-effective methods; Design and implementations; Hardware design; Markov Random Fields; Noise-Tolerant; Cost effectiveness
Type
journal article