https://scholars.lib.ntu.edu.tw/handle/123456789/153852
Title: | Examination of the Insulating Property of Ta205 in Al/Ta205/Si02/Si Capacitors from the Equivalent Low-Frequency Capacitance Behavior | Authors: | 胡振國 Lin, S. T. Hwu, Jenn-Gwo |
Issue Date: | 1989 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153901 |
Appears in Collections: | 電機工程學系 |
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