https://scholars.lib.ntu.edu.tw/handle/123456789/153852
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 胡振國 | zh-TW |
dc.contributor.author | Lin, S. T. | zh-TW |
dc.contributor.author | Hwu, Jenn-Gwo | en |
dc.creator | Lin, S. T.; Hwu, Jenn-Gwo | - |
dc.date | 1989 | en |
dc.date.accessioned | 2009-04-27T04:09:59Z | - |
dc.date.accessioned | 2018-07-06T15:01:09Z | - |
dc.date.available | 2009-04-27T04:09:59Z | - |
dc.date.available | 2018-07-06T15:01:09Z | - |
dc.date.issued | 1989 | - |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/153901 | - |
dc.language | en | en |
dc.language.iso | en_US | - |
dc.title | Examination of the Insulating Property of Ta205 in Al/Ta205/Si02/Si Capacitors from the Equivalent Low-Frequency Capacitance Behavior | en |
dc.type | report | en |
item.fulltext | no fulltext | - |
item.languageiso639-1 | en_US | - |
item.openairecristype | http://purl.org/coar/resource_type/c_93fc | - |
item.cerifentitytype | Publications | - |
item.openairetype | report | - |
item.grantfulltext | none | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Internal Medicine-NTUHHC | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.orcid | 0000-0001-6246-8803 | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | NTU Hsin-Chu Hospital | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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