https://scholars.lib.ntu.edu.tw/handle/123456789/296940| Title: | Role of stress in irradiation-then-anneal technique used for improving radiation hardness of metal-insulator-semiconductor devices | Authors: | Shu, K. Liao, C. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 1992 | Journal Volume: | 61 | Journal Issue: | 6 | Start page/Pages: | 675-677 | Source: | Applied Physics Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0012561306&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/296940 |
DOI: | 10.1063/1.107819 |
| Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.