https://scholars.lib.ntu.edu.tw/handle/123456789/301814| Title: | Stress distribution on (100) Si wafer mapped by novel I-V analysis of MOS tunneling diodes | Authors: | JENN-GWO HWU | Issue Date: | 2003 | Journal Volume: | 24 | Journal Issue: | 6 | Start page/Pages: | 408-410 | Source: | IEEE Electron Device Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0042091972&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/301814 |
DOI: | 10.1109/LED.2003.813365 |
| Appears in Collections: | 電機工程學系 |
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